题　目：Development of 10 nm X‐ray Microscopy: X‐ray Nanofocusing Optics to Science Experiments 

报告人：Yong S. Chu(Hard X-ray Nanoprobe Beamline Group Leader at National Synchrotron Light Source II, Brookhaven National Laboratory, USA)
时　间：12月19日（周四），上午10:00
地　点：物理馆512会议室

报告摘要：

The Hard X‐ray Nanoprobe (HXN) Beamline at NSLS‐II is under construction in order to achieve an initial spatial resolution goal of 10 nm for a wide range of science experiments. With significant resolution enhancement from the other competing Nanoprobes around the world, the HXN beamline is aiming at exploring new frontiers of x‐ray microscopy, virtually eliminating large resolution gap between electron and visible‐light microscopy.      Substantial R&D and designing efforts have been made for fabricating high‐resolution multilayer Laue lenses (MLLs), designing a scanning x‐ray microscope with 1nm positioning/scanning stability, and constructing a beamline that takes full advantage of the NSLS‐II source brightness and ensures sufficient stability for microscopy experiments.  

The presentation will primarily focus on the recent progress in fabricating large‐aperture MLLs, x‐ray characterization of MLLs and development of an MLL x‐ray microscope for science experiments.

个人简介：

2009-present: Hard X-ray Nanoprobe Beamline Group Leader at NSLS-II, Brookhaven National Laboratory.

2009-2014: Graduate Term Faculty at Department of Physics and Astronomy, University of North Carolina at Chapel Hill ？     

2000-2008: Physicist at Advanced Photon Source, Argonne National Laboratory

2000-2005: Assistant Physicist at Advanced Photon Source, Argonne National Laboratory

1999-2000: Postdoctoral Fellow at Advanced Photon Source, Argonne National Laboratory

1997-1999: Postdoctoral Fellow at the Material Science Division, Argonne National Laboratory

Ph.D. in physics, University of Illinois, Urbana, IL, 1997

M.S. in physics, University of Illinois, Urbana, IL, 1990

B.S. in physics, California Institute of Technology, Pasadena, Ca, 1989

专业领域：

X-ray Microscopy and Imaging

Synchrotron Instrumentation and X-ray Optics

X-ray Diffraction and Scattering